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eol product document no. e0189h40 (ver. 4.0) date published september 2002 (k) japan url: http://www.elpida.com ? elpida memory, inc. 2001-2002 elpida memory, inc. is a joint venture dram company of nec corporation and hitachi, ltd. data sheet 512mb ddr sdram so dimm HB54R5128KN-A75B/b75b/10b (64m words 64 bits, 2 banks) description the hb54r5128kn is double data rate (ddr) sdram module, mounted 256m bits ddr sdram (hm5425801btb) sealed in tcp package, and 1 piece of serial eeprom (2k bits eeprom) for presence detect (pd). the hb54r5128kn is organized as 32m 64 2 banks mounted 16 pieces of 256m bits ddr sdram. read and write operations are performed at the cross points of the ck and the /ck. this high- speed data transfer is realized by the 2 bits prefetch- pipelined architecture. data strobe (dqs) both for read and write are available for high speed and reliable data bus design. by setting extended mode register, the on-chip delay locked loop (dll) can be set enable or disable. an outline of the products is 200-pin socket type package (dual lead out). therefore, it makes high density mounting possible without surface mount technology. it provides common data inputs and outputs. decoupling capacitors are mounted beside each tcp on the module board. note: do not push the cover or drop the modules in order to protect from mechanical defects, which would be electrical defects. features ? 200-pin socket type package (dual lead out) ? outline: 67.6mm (length) 31.75mm (height) 3.80mm (thickness) ? lead pitch: 0.6mm ? 2.5v power supply (vcc) ? sstl-2 interface for all inputs and outputs ? clock frequency: 133 mhz (max) (-a75b/b75b) : 100 mhz (max) (-10b) ? data inputs, outputs and dm are synchronized with dqs ? 4 banks can operate simultaneously and independently (component) ? burst read/write operation ? programmable burst length: 2, 4, 8 ? burst read stop capability ? programmable burst sequence ? sequential ? interleave ? start addressing capability ? even and odd ? programmable /cas latency (cl): 2, 2.5 ? 8192 refresh cycles: 7.8 s (8192row/64ms) ? 2 variations of refresh ? auto refresh ? self refresh
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 2 ordering information part number clock frequency mhz (max.) /cas latency package contact pad HB54R5128KN-A75B* 1 hb54r5128kn-b75b* 2 hb54r5128kn-10b* 3 133 mhz 133 mhz 125 mhz 2.0 2.5 2.0 200-pin dual lead out socket type gold notes: 1. 143 mhz operation at /cas latency = 2.5. 2. 100 mhz operation at /cas latency = 2.0. 3. 125 mhz operation at /cas latency = 2.5. pin configurations 1 pin 2 pin front side back side 39 pin 40 pin 41 pin 42 pin 199 pin 200 pin pin no. pin name pin no. pin name pin no. pin name pin no. pin name 1 vref 51 vss 2 vref 52 vss 3 vss 53 dq19 4 vss 54 dq23 5 dq0 55 dq24 6 dq4 56 dq28 7 dq1 57 vcc 8 dq5 58 vcc 9 vcc 59 dq25 10 vcc 60 dq29 11 dqs0 61 dqs3 12 dm0 62 dm3 13 dq2 63 vss 14 dq6 64 vss 15 vss 65 dq26 16 vss 66 dq30 17 dq3 67 dq27 18 dq7 68 dq31 19 dq8 69 vcc 20 dq12 70 vcc 21 vcc 71 nc 22 vcc 72 nc 23 dq9 73 nc 24 dq13 74 nc 25 dqs1 75 vss 26 dm1 76 vss 27 vss 77 nc 28 vss 78 nc 29 dq10 79 nc 30 dq14 80 nc 31 dq11 81 vcc 32 dq15 82 vcc 33 vcc 83 nc 34 vcc 84 nc 35 ck0 85 nc 36 vcc 86 nc 37 /ck0 87 vss 38 vss 88 vss 39 vss 89 ck2 40 vss 90 vss 41 dq16 91 /ck2 42 dq20 92 vcc 43 dq17 93 vcc 44 dq21 94 vcc 45 vcc 95 cke1 46 vcc 96 cke0 47 dqs2 97 nc 48 dm2 98 nc 49 dq18 99 a12 50 dq22 100 a11
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 3 pin no. pin name pin no. pin name pin no. pin name pin no. pin name 101 a9 151 dq42 102 a8 152 dq46 103 vss 153 dq43 104 vss 154 dq47 105 a7 155 vcc 106 a6 156 vcc 107 a5 157 vcc 108 a4 158 /ck1 109 a3 159 vss 110 a2 160 ck1 111 a1 161 vss 112 a0 162 vss 113 vcc 163 dq48 114 vcc 164 dq52 115 a10/ap 165 dq49 116 ba1 166 dq53 117 ba0 167 vcc 118 /ras 168 vcc 119 /we 169 dqs6 120 /cas 170 dm6 121 /s0 171 dq50 122 /s1 172 dq54 123 nc 173 vss 124 nc 174 vss 125 vss 175 dq51 126 vss 176 dq55 127 dq32 177 dq56 128 dq36 178 dq60 129 dq33 179 vcc 130 dq37 180 vcc 131 vcc 181 dq57 132 vcc 182 dq61 133 dqs4 183 dqs7 134 dm4 184 dm7 135 dq34 185 vss 136 dq38 186 vss 137 vss 187 dq58 138 vss 188 dq62 139 dq35 189 dq59 140 dq39 190 dq63 141 dq40 191 vcc 142 dq44 192 vcc 143 vcc 193 sda 144 vcc 194 sa0 145 dq41 195 scl 146 dq45 196 sa1 147 dqs5 197 vccspd 148 dm5 198 sa2 149 vss 199 vccid 150 vss 200 nc
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 4 pin description pin name function a0 to a12 address input row address a0 to a12 column address a0 to a9 ba0, ba1 bank select address dq0 to dq63 data input/output /ras row address strobe command /cas column address strobe command /we write enable /s0, /s1 chip select cke0, cke1 clock enable ck0 to ck2 clock input /ck0 to /ck2 differential clock input dqs0 to dqs7 input and output data strobe dm0 to dm7 input mask scl clock input for serial pd sda data input/output for serial pd sa0 to sa2 serial address input vcc power for internal circuit vccspd power for serial eeprom vref input reference voltage vss ground vccid vcc identification flag nc no connection
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 5 serial pd matrix* 1 byte no. function described bit7 bit6 bit5 bit4 bit3 bit2 bit1 bit0 hex value comments 0 number of bytes utilized by module manufacturer 1 0 0 0 0 0 0 0 80 128 1 total number of bytes in serial pd device 0 0 0 0 1 0 0 0 08 256 byte 2 memory type 0 0 0 0 0 1 1 1 07 sdram ddr 3 number of row address 0 0 0 0 1 1 0 1 0d 13 4 number of column address 0 0 0 0 1 0 1 0 0a 10 5 number of dimm banks 0 0 0 0 0 0 1 0 02 2 6 module data width 0 1 0 0 0 0 0 0 40 64 bits 7 module data width continuation 0 0 0 0 0 0 0 0 00 0 (+) 8 voltage interface level of this assembly 0 0 0 0 0 1 0 0 04 sstl 2.5v 9 ddr sdram cycle time, cl = x -a75b 0 1 1 1 0 0 0 0 70 cl = 2.5* 5 -b75b 0 1 1 1 0 1 0 1 75 -10b 1 0 0 0 0 0 0 0 80 10 sdram access from clock (tac) -a75b/b75b 0 1 1 1 0 1 0 1 75 0.75ns* 5 -10b 1 0 0 0 0 0 0 0 80 0.8ns* 5 11 dimm configuration type 0 0 0 0 0 0 0 0 00 none 12 refresh rate/type 1 0 0 0 0 0 1 0 82 7.8 s self refresh 13 primary sdram width 0 0 0 0 1 0 0 0 08 8 14 error checking sdram width 0 0 0 0 0 0 0 0 00 not used 15 sdram device attributes: minimum clock delay back-to-back column access 0 0 0 0 0 0 0 1 01 1 clk 16 sdram device attributes: burst length supported 0 0 0 0 1 1 1 0 0e 2, 4, 8 17 sdram device attributes: number of banks on sdram device 0 0 0 0 0 1 0 0 04 4 18 sdram device attributes: /cas latency 0 0 0 0 1 1 0 0 0c 2, 2.5 19 sdram device attributes: /cs latency 0 0 0 0 0 0 0 1 01 0 20 sdram device attributes: /we latency 0 0 0 0 0 0 1 0 02 1 21 sdram module attributes 0 0 1 0 0 0 0 0 20 unbuffered 22 sdram device attributes: general 1 1 0 0 0 0 0 0 c0 0.2v 23 minimum clock cycle time at clx - 0.5 -a75b 0 1 1 1 0 1 0 1 75 cl = 2* 5 -b75b/10b 1 0 1 0 0 0 0 0 a0 24 maximum data access time (tac) from clock at clx - 0.5 -a75b/b75b 0 1 1 1 0 1 0 1 75 0.75ns* 5 -10b 1 0 0 0 0 0 0 0 80 0.8ns* 5 25 minimum clock cycle time at clx - 1 0 0 0 0 0 0 0 0 00 26 maximum data access time (tac) from clock at clx - 1 0 0 0 0 0 0 0 0 00 27 minimum row precharge time (trp) 0 1 0 1 0 0 0 0 50 20ns
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 6 byte no. function described bit7 bit6 bit5 bit4 bit3 bit2 bit1 bit0 hex value comments 28 minimum row active to row active delay (trrd) 0 0 1 1 1 1 0 0 3c 15ns 29 minimum /ras to /cas delay (trcd) 0 1 0 1 0 0 0 0 50 20ns 30 minimum active to precharge time (tras) -a75b/b75b 0 0 1 0 1 1 0 1 2d 45ns -10b 0 0 1 1 0 0 1 0 32 50ns 31 module bank density 0 1 0 0 0 0 0 0 40 2 banks 256mb 32 address and command setup time before clock (tis) -a75b/b75b 1 0 0 1 0 0 0 0 90 0.9ns* 5 -10b 1 0 1 1 0 0 0 0 b0 1.1ns* 5 33 address and command hold time after clock (tih) -a75b/b75b 1 0 0 1 0 0 0 0 90 0.9ns* 5 -10b 1 0 1 1 0 0 0 0 b0 1.1ns* 5 34 data input setup time before clock (tds) -a75b/b75b 0 1 0 1 0 0 0 0 50 0.5ns* 5 -10b 0 1 1 0 0 0 0 0 60 0.6ns* 5 35 data input hold time after clock (tdh) -a75b/b75b 0 1 0 1 0 0 0 0 50 0.5ns* 5 -10b 0 1 1 0 0 0 0 0 60 0.6ns* 5 36 to 40 superset information 0 0 0 0 0 0 0 0 00 future use 41 active command period (trc) -a75b/b75b 0 1 0 0 0 0 0 1 41 65ns* 5 -10b 0 1 0 0 0 1 1 0 46 70ns* 5 42 auto refresh to active/ auto refresh command cycle (trfc) -a75b/b75b 0 1 0 0 1 0 1 1 4b 75ns* 5 -10b 0 1 0 1 0 0 0 0 50 80ns* 5 43 sdram tck cycle max. (tck max.) 0 0 1 1 0 0 0 0 30 12ns* 5 44 dout to dqs skew -a75b/b75b 0 0 1 1 0 0 1 0 32 500ps* 5 -10b 0 0 1 1 1 1 0 0 3c 600ps* 5 45 data hold skew (tqhs) -a75b/b75b 0 1 1 1 0 1 0 1 75 750ps* 5 -10b 1 0 1 0 0 0 0 0 a0 1000ps* 5 46 to 61 superset information 0 0 0 0 0 0 0 0 00 future use 62 spd revision 0 0 0 0 0 0 0 0 00 initial 63 checksum for bytes 0 to 62 -a75b 1 0 1 1 0 0 1 1 b3 179 -b75b 1 1 1 0 0 0 1 1 e3 227 -10b 1 0 1 0 1 0 0 0 a8 168 64 manufacturer?s jedec id code 0 0 0 0 0 1 1 1 07 hitachi 65 to 71 manufacturer?s jedec id code 0 0 0 0 0 0 0 0 00 72 manufacturing location * 2 (ascii-8bit code) 73 module part number 0 1 0 0 1 0 0 0 48 h 74 module part number 0 1 0 0 0 0 1 0 42 b 75 module part number 0 0 1 1 0 1 0 1 35 5
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 7 byte no. function described bit7 bit6 bit5 bit4 bit3 bit2 bit1 bit0 hex value comments 76 module part number 0 0 1 1 0 1 0 0 34 4 77 module part number 0 1 0 1 0 0 1 0 52 r 78 module part number 0 0 1 1 0 1 0 1 35 5 79 module part number 0 0 1 1 0 0 0 1 31 1 80 module part number 0 0 1 1 0 0 1 0 32 2 81 module part number 0 0 1 1 1 0 0 0 38 8 82 module part number 0 1 0 0 1 0 1 1 4b k 83 module part number 0 1 0 0 1 1 1 0 4e n 84 module part number 0 0 1 0 1 1 0 1 2d ? 85 module part number -a75b 0 1 0 0 0 0 0 1 41 a -b75b 0 1 0 0 0 0 1 0 42 b -10b 0 0 1 1 0 0 0 1 31 1 86 module part number -a75b/b75b 0 0 1 1 0 1 1 1 37 7 -10b 0 0 1 1 0 0 0 0 30 0 87 module part number -a75b/b75b 0 0 1 1 0 1 0 1 35 5 -10b 0 1 0 0 0 0 1 0 42 b 88 module part number -a75b/b75b 0 1 0 0 0 0 1 0 42 b -10b 0 0 1 0 0 0 0 0 20 (space) 89 to 90 module part number 0 0 1 0 0 0 0 0 20 (space) 91 revision code 0 0 1 1 0 0 0 0 30 initial 92 revision code 0 0 1 0 0 0 0 0 20 (space) 93 manufacturing date year code (bcd) 94 manufacturing date week code (bcd) 95 to 98 module serial number * 3 99 to 127 manufacturer specific data * 4 notes: 1. all serial pd data are not protected. 0: serial data, ?driven low?, 1: serial data, ?driven high? these spd are based on jedec committee ballot jc-42.5-99-129. 2. byte72 is manufacturing location code. (ex: in case of japan, byte72 is 4ah. 4ah shows ?j? on ascii code.) 3. bytes 95 through 98 are assembly serial number. 4. all bits of 99 through 127 are not defined (?1? or ?0?). 5. these specifications are defined based on component specification, not module.
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 8 block diagram dm0 sdrams (d0 to d15) sdrams (d0 to d15) ba0 to ba1 sdrams (d0 to d15) cke0 sdrams (d0 to d7) cke1 sdrams (d8 to d15) vccspd spd vref sdrams (d0 to d15) vcc sdrams (d0 to d15), and vss vccid vcc vccq open sdrams (d0 to d15), spd sdrams (d0 to d15), spd serial pd sda a0 a1 a2 wp scl sa0 sa1 sa2 u0 sda scl notes : 1. dq wiring may differ from that described in this drawing; however dq/dm/dqs relationships are maintained as shown. vccid strap connections: (for memory device vcc, vccq) strap out (open): vcc = vccq strap in (closed): vcc ?
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 9 logical clock net structure dram1 = dram5 8dram loads 120 ?
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 10 pin functions (1) ck (clk), /ck (/clk) (input pin): the ck and the /ck are the master clock inputs. all inputs except dms, dqss and dqs are referred to the cross point of the ck rising edge and the vref level. when a read operation, dqss and dqs are referred to the cross point of the ck and the /ck. when a write operation, dms and dqs are referred to the cross point of the dqs and the vref level. dqss for write operation are referred to the cross point of the ck and the /ck. /s (/cs) (input pin): when /s is low, commands and data can be input. when /s is high, all inputs are ignored. however, internal operations (bank active, burst operations, etc.) are held. /ras, /cas, and /we (input pins): these pins define operating commands (read, write, etc.) depending on the combinations of their voltage levels. see "command operation". a0 to a12 (input pins): row address (ax0 to ax12) is determined by the a0 to the a12 level at the cross point of the ck rising edge and the vref level in a bank active command cycle. column address (ay0 to ay9) is loaded via the a0 to the a9 at the cross point of the ck rising edge and the vref level in a read or a write command cycle. this column address becomes the starting address of a burst operation. a10 (ap) (input pin): a10 defines the precharge mode when a precharge command, a read command or a write command is issued. if a10 = high when a precharge command is issued, all banks are precharged. if a10 = low when a precharge command is issued, only the bank that is selected by ba1, ba0 is precharged. if a10 = high when read or write command, auto-precharge function is enabled. while a10 = low, auto-precharge function is disabled. ba0, ba1 (input pin): ba0/ba1 are bank select signals. the memory array is divided into bank 0, bank 1, bank 2 and bank 3. if ba1 = low and ba0 = low, bank 0 is selected. if ba1 = high and ba0 = low, bank 1 is selected. if ba1 = low and ba0 = high, bank 2 is selected. if ba1 = high and ba0 = high, bank 3 is selected. cke (input pin): cke controls power down and self-refresh. the power down and the self-refresh commands are entered when the cke is driven low and exited when it resumes to high. the cke level must be kept for 1 ck cycle (= lckepw) at least, that is, if cke changes at the cross point of the ck rising edge and the vref level with proper setup time tis, at the next ck rising edge cke level must be kept with proper hold time tih. pin functions (2) dq (input and output pins): data are input to and output from these pins. dqs (input and output pin): dqs provide the read data strobes (as output) and the write data strobes (as input). dm (input pins): dm is the reference signal of the data input mask function. dms are sampled at the cross point of dqs and vref vcc and vccq (power supply pins): 2.5v is applied. (vcc is for the internal circuit and vccq is for the output buffer.) vccspd (power supply pin): 2.5v is applied (for serial eeprom). vss (power supply pin): ground is connected. detailed operation part, ac characteristics and timing waveforms refer to the hm5425161b/hm5425801b/hm5425401b series datasheet (e0086h).
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 11 electrical specifications absolute maximum ratings parameter symbol value unit note voltage on any pin relative to vss vt ?1.0 to +4.6 v 1 supply voltage relative to vss vcc, vccq ?1.0 to +4.6 v 1 short circuit output current iout 50 ma power dissipation pt 8 w operating temperature topr 0 to +65 c storage temperature tstg ?50 to +100 c notes: 1. respect to vss. dc operating conditions (ta = 0 to +65c) parameter symbol min. typ max. unit notes supply voltage vcc, vccq 2.3 2.5 2.7 v 1, 2 vss 0 0 0 v input reference voltage vref 1.15 1.25 1.35 v 1 termination voltage vtt vref ? 0.04 vref vref + 0.04 v 1 dc input high voltage vih vref + 0.18 ? vccq + 0.3 v 1, 3 dc input low voltage vil ?0.3 ? vref ? 0.18 v 1, 4 dc input signal voltage vin (dc) ?0.3 ? vccq + 0.3 v 5 dc differential input voltage vswing (dc) 0.36 ? vccq + 0.6 v 6 ambient illuminance ? ? ? 100 lx notes: 1. all parameters are referred to vss, when measured. 2. vccq must be lower than or equal to vcc. 3. vih is allowed to exceed vcc up to 4.6v for the period shorter than or equal to 5ns. 4. vil is allowed to outreach below vss down to ?1.0v for the period shorter than or equal to 5ns. 5. vin (dc) specifies the allowable dc execution of each differential input. 6. vswing (dc) specifies the input differential voltage required for switching.
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 12 dc characteristics 1 (ta = 0 to 65c, vcc, vccq = 2.5v 0.2v, vss = 0v) parameter symbol grade max. unit test condition notes operating current (actv-pre) icc0 -a75b -b75b -10b 1200 1120 960 ma cke vih, trc = min. 1, 2, 5 operating current (actv-read-pre) icc1 -a75b -b75b -10b 1640 1520 1360 ma cke vih, bl = 2, cl = 2.5, trc = min. 1, 2, 5 idle power down standby current icc2p -a75b -b75b -10b 288 240 192 ma cke vil 4 idle standby current icc2n -a75b -b75b -10b 640 560 480 ma cke vih, /cs vih 4 active power down standby current icc3p -a75b -b75b -10b 400 320 240 ma cke vil 3 active standby current icc3n -a75b -b75b -10b 800 720 640 ma cke vih, /cs vih tras = max. 3 operating current (burst read operation) icc4r -a75b -b75b -10b 2200 2080 1960 ma cke vih, bl = 2, cl = 2.5 1, 2, 5, 6 operating current (burst write operation) icc4w -a75b -b75b -10b 2040 1920 1800 ma cke vih, bl = 2, cl = 2.5 1, 2, 5, 6 auto refresh current icc5 -a75b -b75b -10b 2040 1960 1760 ma trfc = min., input vil or vih self refresh current icc6 48 ma input vcc ? 0.2v input 0.2v. notes. 1. these icc data are measured under condition that dq pins are not connected. 2. one bank operation. 3. one bank active. 4. all banks idle. 5. command/address transition once per one cycle. 6. data/data mask transition twice per one cycle. 7. the icc data on this table are measured with regard to tck = min. in general. dc characteristics2 (ta = 0 to 65c, vcc, vccq = 2.5v 0.2v, vss = 0v) parameter symbol min. max. unit test condition notes input leakage current ili ?10 10 a vcc vin vss output leakage current ilo ?10 10 a vcc vout vss output high voltage voh vtt + 0.76 ? v ioh (max.) = ?15.2ma output low voltage vol ? vtt ? 0.76 v iol (min.) = 15.2ma
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 13 pin capacitance (ta = 25c, vcc, vccq = 2.5v 0.2v) parameter symbol pins min. max. unit notes input capacitance ci1 address, /ras, /cas, /we ? 90 pf 1 input capacitance ci2 cke, /s ck, /ck ? 60 pf 1 data and dqs input/output capacitance co dq, dqs, dm ? 30 pf 1, 2 notes: 1. these parameters are measured on conditions: f = 100mhz, vout = vccq/2, ? vout = 0.2v. 2. dout circuits are disabled. timing parameter measured in clock cycle for unbuffered dimm number of clock cycle parameter symbol min. max. write to pre-charge command delay (same bank) twpd 3 + bl/2 read to pre-charge command delay (same bank) trpd bl/2 write to read command delay (to input all data) twrd 2 + bl/2 burst stop command to write command delay (cl = 2) tbstw 2 (cl = 2.5) tbstw 3 burst stop command to dq high-z (cl = 2) tbstz 2 (cl = 2.5) tbstz 2.5 read command to write command delay (to output all data) (cl = 2) trwd 2 + bl/2 (cl = 2.5) trwd 3 + bl/2 pre-charge command to high-z (cl = 2) thzp 2 (cl = 2.5) thzp 2.5 write command to data in latency twcd 1 write recovery twr 2 dm to data in latency tdmd 0 register set command to active or register set command tmrd 2 self refresh exit to non-read command tsnr 10 self refresh exit to read command tsrd 200 power down entry tpden 1 power down exit to command input tpdex 1 cke minimum pulse width tckepw 1
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 14 physical outline r0.50
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 15 caution for handling memory modules when handling or inserting memory modules, be sure not to touch any components on the modules, such as the memory ics, chip capacitors and chip resistors. it is necessary to avoid undue mechanical stress on these components to prevent damaging them. in particular, do not push module cover or drop the modules in order to protect from mechanical defects, which would be electrical defects. when re-packing memory modules, be sure the modules are not touching each other. modules in contact with other modules may cause excessive mechanical stress, which may damage the modules. mde0202 notes for cmos devices 1 precaution against esd for mos devices exposing the mos devices to a strong electric field can cause destruction of the gate oxide and ultimately degrade the mos devices operation. steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it, when once it has occurred. environmental control must be adequate. when it is dry, humidifier should be used. it is recommended to avoid using insulators that easily build static electricity. mos devices must be stored and transported in an anti-static container, static shielding bag or conductive material. all test and measurement tools including work bench and floor should be grounded. the operator should be grounded using wrist strap. mos devices must not be touched with bare hands. similar precautions need to be taken for pw boards with semiconductor mos devices on it. 2 handling of unused input pins for cmos devices no connection for cmos devices input pins can be a cause of malfunction. if no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. cmos devices behave differently than bipolar or nmos devices. input levels of cmos devices must be fixed high or low by using a pull-up or pull-down circuitry. each unused pin should be connected to v dd or gnd with a resistor, if it is considered to have a possibility of being an output pin. the unused pins must be handled in accordance with the related specifications. 3 status before initialization of mos devices power-on does not necessarily define initial status of mos devices. production process of mos does not define the initial operation status of the device. immediately after the power source is turned on, the mos devices with reset function have not yet been initialized. hence, power-on does not guarantee output pin levels, i/o settings or contents of registers. mos devices are not initialized until the reset signal is received. reset operation must be executed immediately after power-on for mos devices having reset function. cme0107
eol product HB54R5128KN-A75B/b75b/10b data sheet e0189h40 (ver. 4.0) 16 m01e0107 no part of this document may be copied or reproduced in any form or by any means without the prior written consent of elpida memory, inc. elpida memory, inc. does not assume any liability for infringement of any intellectual property rights (including but not limited to patents, copyrights, and circuit layout licenses) of elpida memory, inc. or third parties by or arising from the use of the products or information listed in this document. no license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of elpida memory, inc. or others. descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. the incorporation of these circuits, software and information in the design of the customer's equipment shall be done under the full responsibility of the customer. elpida memory, inc. assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. [product applications] elpida memory, inc. makes every attempt to ensure that its products are of high quality and reliability. however, users are instructed to contact elpida memory's sales office before using the product in aerospace, aeronautics, nuclear power, combustion control, transportation, traffic, safety equipment, medical equipment for life support, or other such application in which especially high quality and reliability is demanded or where its failure or malfunction may directly threaten human life or cause risk of bodily injury. [product usage] design your application so that the product is used within the ranges and conditions guaranteed by elpida memory, inc., including the maximum ratings, operating supply voltage range, heat radiation characteristics, installation conditions and other related characteristics. elpida memory, inc. bears no responsibility for failure or damage when the product is used beyond the guaranteed ranges and conditions. even within the guaranteed ranges and conditions, consider normally foreseeable failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the equipment incorporating elpida memory, inc. products does not cause bodily injury, fire or other consequential damage due to the operation of the elpida memory, inc. product. [usage environment] this product is not designed to be resistant to electromagnetic waves or radiation. this product must be used in a non-condensing environment. if you export the products or technology described in this document that are controlled by the foreign exchange and foreign trade law of japan, you must follow the necessary procedures in accordance with the relevant laws and regulations of japan. also, if you export products/technology controlled by u.s. export control regulations, or another country's export control laws or regulations, you must follow the necessary procedures in accordance with such laws or regulations. if these products/technology are sold, leased, or transferred to a third party, or a third party is granted license to use these products, that third party must be made aware that they are responsible for compliance with the relevant laws and regulations. the information in this document is subject to change without notice. before using this document, confirm that this is the late st version.

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